Results
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Technology evolution for silicon nano-electronics [electronic resource] : selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan / edited by Seiichi Miyazaki and Hitoshi Tabata. by Series: Key engineering materials ; v. 470
Material type:  Text; Format:
electronic
available online
 ; Literary form:
Not fiction
Publication details: Stafa-Zurich, Switzerland ; Enfield, N.H. : Trans Tech Publications, c2011
Other title:
- Proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics
- International Symposium on Technology Evolution for Silicon Nano-Electronics
Availability: Items available for loan: TUS: Midlands, Main Library (1)Location, call number: Athlone Online eBook.
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Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine / edited by Alexei N. Nazarov and Jean-Pierre Raskin. [electronic resource] by Series: Advanced materials research ; 276.
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Durnten-Zurich, Switzerland : Trans Tech Publications, [2011]Distributor: Enfield, N.H. : Distributed in the Americas by Trans Tech Publications, [date of distribution not identified]Copyright date: ©2011
Availability: Items available for loan: TUS: Midlands, Main Library (1)Location, call number: Athlone Online eBook.
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Fractional kinetics in solids [electronic resource] : anomalous charge transport in semiconductors, dielectrics, and nanosystems / Vladimir Uchaikin, Ulyanovsk State University, Russia, Renat Sibatov, Ulyanovsk State University, Russia. by
Material type: Text; Format:
electronic
available online
; Literary form:
Not fiction
Publication details: Singapore : World Scientific, 2013
Availability: Items available for loan: TUS: Midlands, Main Library (1)Location, call number: Athlone Online eBook.
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Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai. [electronic resource] by Series: Materials science forum ; v. 725.
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]Copyright date: ©2012
Availability: Items available for loan: TUS: Midlands, Main Library (1)Location, call number: Athlone Online eBook.
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ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International. [electronic resource] by
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Materials Park, Ohio : ASM International, [2015]Copyright date: ©2015
Availability: Items available for loan: TUS: Midlands, Main Library (1)Location, call number: Athlone Online eBook.
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