Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. [electronic resource]

By:

(3rd : International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China)

Contributor(s):

Material type: Text

TextSeries: Applied mechanics and materials ; Volume 568-570.Publisher: Zurich, Switzerland : TTP, 2014Copyright date: ©2014Description: 1 online resource (2012 pages) : illustrations (some color), graphs, tablesISBN:

9783038265214 (e-book)

Other title:

ICMIA 2014

Subject(s):

Genre/Form:

Electronic books.

Additional physical formats: Print version:: Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China.DDC classification:

681.2 23

LOC classification:

TA165 .I584 2014

Online resources:

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Holdings ( 1 )
Title notes ( 3 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Ebook	TUS: Midlands, Main Library Athlone Online	eBook (Browse shelf(Opens below))	Available

Includes bibliographical references at the end of each chapters and indexes.

Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014).

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.