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Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai. [electronic resource]
Material type:
TextSeries: Materials science forum ; v. 725.Publisher: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]Copyright date: ©2012Description: 1 online resource (300 pages)ISBN: - 9783038138563 (e-book)
- QC611.6.D4 I58 2011
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Ebook | TUS: Midlands, Main Library Athlone Online | eBook (Browse shelf(Opens below)) | Available |
Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.