Advanced production testing of RF, SoC, and SiP devices [electronic resource] / Joe Kelly, Michael Engelhardt.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- TK7895.E42 K49 2007
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Ebook | TUS: Midlands, Main Library Athlone Online | eBook (Browse shelf(Opens below)) | Available |
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.