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Stochastic reliability modeling, optimization and applications [electronic resource] / editors, Syouji Nakamura, Toshio Nakagawa.

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Material type: Text

TextPublication details: Singapore ; Hackensack, NJ : World Scientific, c2010.Description: xvi, 300 p. : illSubject(s):

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Item type	Current library	Call number	Status	Date due	Barcode
Ebook	TUS: Midlands, Main Library Athlone Online	eBook (Browse shelf(Opens below))	Available

Includes bibliographical references.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.