System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Material type:
TextSeries: Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.Description: xxxvi, 856 p. : illSubject(s): Genre/Form: DDC classification: - 621.39/5 22
- TK7895.E42 S978 2008
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Ebook | TUS: Midlands, Main Library Athlone Online | eBook (Browse shelf(Opens below)) | Available |
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Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.