Auger Electron Spectroscopy : Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films. [electronic resource]

By:

Wolstenholme, John

Material type: Text

Media type:

Carrier type:

ISBN:

9781606506820

Subject(s):

Genre/Form:

Electronic books.

Additional physical formats: Print version:: Auger Electron Spectroscopy : Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin FilmsDDC classification:

543.62

LOC classification:

QC793.5
QD96

Online resources:

Click to View

Contents:

Cover -- Contents -- List of Figures -- List of Tables -- Foreword -- Preface -- Acknowledgments -- Chapter 1: Introduction -- Chapter 2: The Interaction of Electrons with Solid Materials -- Chapter 3: AES Methodologies -- Chapter 4: Instrumentation for Auger Analysis -- Chapter 5: Auger Electron Spectroscopy in Materials Analysis -- Chapter 6: Analytical Methods for the Characterization of Materials -- Appendix 1: Abbreviations and Acronyms -- Appendix 2: Quantum Numbers -- Appendix 3: Comparison of Surface and Thin Film Analysis Techniques -- Appendix 4: Standardization in Surface Analysis -- Appendix 5: Sources of the Figures -- Further Reading -- Index -- Ad page -- Backcover.

Summary: This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated and the application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative terms. Major components of typical Auger spectrometers are also described. The book discusses other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, as well as the relationship between AES and other analysis techniques.

Holdings ( 1 )
Title notes ( 4 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Ebook	TUS: Midlands, Main Library Athlone Online	eBook (Browse shelf(Opens below))	Available

This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated and the application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative terms. Major components of typical Auger spectrometers are also described. The book discusses other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, as well as the relationship between AES and other analysis techniques.

Description based on publisher supplied metadata and other sources.

Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2018. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.

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