VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 621.39/5 22
- TK7874.75 .V587 2006
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Ebook | TUS: Midlands, Main Library Athlone Online | eBook (Browse shelf(Opens below)) | Available |
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.